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Electronics Design Group
Results: 177

#	Item
71	GSA AMS Working Group Meeting Synopsys, Mountain View, CA \| February 20, 2014 AMS Working Group Meeting Minutes from the meeting February 20, 2014 Add to Reading List Source URL: www.gsaglobal.org Language: English - Date: 2014-04-02 15:09:02 Synopsys Silvaco Mentor Graphics Hardware description languages Electronic design automation Logic design Electronic engineering Digital electronics Hillsboro Oregon
72	FPGA Design of a Camera Control System for Road Traffic Monitoring George K. Adam, Georgia Garani, Dimitrios Ventzas Computer Science and Engineering Technological Educational Institute of Thessaly, Larissa, Greece Add to Reading List Source URL: www.teilar.gr Language: English Classes of computers Reconfigurable computing Embedded systems Field-programmable gate array Nios II Xilinx Altera Joint Test Action Group VHDL Electronic engineering Electronics Fabless semiconductor companies
73	XJDeveloper www.xjtag.com Overview Add to Reading List Source URL: www.etoolsmiths.com Language: English - Date: 2014-01-08 03:14:22 Electronic engineering Joint Test Action Group Boundary scan Design for testing Field-programmable gate array In-circuit test Atmel AVR Electronics manufacturing Manufacturing Electronics
74	Internet Management and Measurements Measurements Ramin Sadre, Aiko Pras Design and Analysis of Communication Systems Group University of Twente, 2010 Add to Reading List Source URL: www.simpleweb.org Language: English - Date: 2010-04-28 11:01:37 Electronics Electronic engineering Networking hardware Router Server appliance Packet loss Throughput Teletraffic engineering Quality of service Teletraffic Network performance Network architecture
75	Page 2 Design Overview LPC3154 Powering and Unused parts Add to Reading List Source URL: www.lpcware.com Language: English - Date: 2015-04-20 11:52:16 Electronics manufacturing Joint Test Action Group Electronic engineering Manufacturing IC power supply pin Electronics Embedded systems IEEE standards
76	onTAP Development Product Description ProScan ProScan is the new graphical test and debug environment that enables easier, more efficient boundary scan testing and programming by localizing all your debug needs and prov Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:22 Manufacturing Electronic engineering IEEE standards Joint Test Action Group Electronic design automation Boundary scan DTS Wiggler Netlist Electronics Embedded systems Electronics manufacturing
77	Page 2 Design Overview LPC3154 Powering and Unused parts Add to Reading List Source URL: www.lpcware.com Language: English - Date: 2015-04-14 08:28:59 Joint Test Action Group IC power supply pin Electronic engineering Manufacturing Electronics Embedded systems Electronics manufacturing
78	HC17.S7T1 The Nios II Family of Configurable Soft-core Processors.ppt Add to Reading List Source URL: www.hotchips.org Language: English - Date: 2013-07-27 23:47:48 Nios II Nios embedded processor Field-programmable gate array Altera CPU design Joint Test Action Group Reduced instruction set computing Soft microprocessor LatticeMico32 Electronic engineering Electronics Computer hardware
79	PRESS RELEASE 1/2 Bang & Olufsen and Universal Music deliver the best experience Add to Reading List Source URL: www.bang-olufsen.com Language: English - Date: 2013-05-15 05:01:38 Bang & Olufsen Consumer electronics Bang Universal Music Group Struer Denmark Music industry Danish design Electronics
80	onTAP Manufacturing Product Description Manufacturing Highlights: Manufacturing w/ProScan Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:21 Electromagnetism Electronics manufacturing Electronic design automation Joint Test Action Group OnTap Application-specific integrated circuit Fault coverage Electronic engineering Electronics Integrated circuits

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